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Full text of "USPTO Patents Application 10054184"

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_ System and Method Included withV 
for Independently Testing an Input Signal 

1/3 



10 



12 



14 




11 


CPU 




Memory 



Data Processing System 



18 



Circuit 
Under 
Test 



2 0 





13 


Display 




Scope 



Tig. 1 



Data 



jatajbMcessing System and Method Included within^ 
Osd^Pope for Independently Testing an Input SigiW 

2/3 




100 



Prioritize trigger modes 
into a hierarchy 









108 



Use default 
priority hierarchy 



For each trigger mode, 
specify parameters 
including start and 
stop voltage levels, 
step voltage, and 
sweep rate for each 
voltage level 



r-106 



Tig. 2 



( s,op y 110 



Data Raiessing System and Method Included within a^ 
Oscil^Ppe for Independently Testing an Input Signa^P 



( Start y 



150 



3 



Get next trigger mode 
in priority hierarchy 
and its associated 
parameters 






Set scope 
voltage and 
for this tri 


i for start 
sweep rate 
gger mode 



r152 



r1 54 



156 




158 



Store waveform and 
associated trigger 
parameters. 

Increment number of 
triggers counter. 



Increment current 
voltage level using 
voltage step for 
this trigger mode 



r 164 



Tig. 3 



Reached stop 
voltage ? 



TYes